منابع مشابه
Ferrule-top atomic force microscope.
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We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2006
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.2358710